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Particle-Induced X-Ray Emission Spectrometry (PIXE) by Sven A. E. Johansson, John L. Campbell, Klas G. Malmqvist (Hardcover, 1995)

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The authoritative handbook to exploiting the full power and versatility of PIXE- now and in the next century Respected for its practical accuracy and detection range of parts per million, particle-induced X-ray emission has enjoyed a secure place in the analytical arsenal of the nuclear physics laboratory. Yet, its undeniable analytical potential in other areas of science has scarcely been tapped. This unique reference, from PIXE specialists in biomedicine, atmospheric science, earth science, and art and archaeology, features a user-based look at PIXE's conceptual basics and methodology, with a view toward new and creative analytical work. Touching on every facet of PIXE technology, from basic instrumentation, specimens, the characteristics of X-ray spectroscopy, standardization of quantitative analysis, to the accuracy of PIXE analysis and its limits of detection, the book offers an unprecedented look at the newer uses of PIXE in such areas as: Applications of macro- and micro-PIXE in medicine, zoology, and botany Analysis of atmospheric aerosols Geological and extra-terrestrial material Analysis of gem stones, pottery, glass, and alloys As an exploratory tool for pigments and paintings and paper-like materials Complete with a comparative look contrasting PIXE with more conventional forms of analysis, this important reference is key to grasping the technique's practical specifics and exploiting its full analytical potential.