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Mos Interface Physics, Process and Characterizati on by Shengkai Wang [Hardback]
£81.43
RRP £84.99
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eBay item number:375520760999
Item specifics
- Condition
- EAN
- 9781032106274
- UPC
- 9781032106274
- ISBN
- 9781032106274
- MPN
- N/A
- Book Title
- Mos Interface Physics, Process and Characterizatio
- Item Length
- 22.9 cm
- Subject Area
- Material Science, Electrical Engineering
- Publication Name
- Mos Interface Physics, Process and Characterization
- Publisher
- Taylor & Francis LTD
- Subject
- Engineering & Technology
- Publication Year
- 2021
- Type
- Textbook
- Format
- Hardcover
- Language
- English
- Item Height
- 229 mm
- Item Weight
- 481 g
- Item Width
- 152 mm
- Number of Pages
- 162 Pages
About this product
Product Information
The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit, and is therefore a fundamental building block of the information society. Indeed, high quality MOS structure is the key to achieving high performance devices and integrated circuits. Meanwhile, the control of interface physics, process and characterization methods determine the quality of MOS structure. This book tries to answer five key questions: Why are high-performance integrated circuits bonded together so closely with MOS structure? Which physical phenomena occur in MOS structure? How do these phenomena affect the performance of MOS structure? How can we observe and quantify these phenomena scientifically? How to control the above phenomena through process? Principles are explained based on common experimental phenomena, from sensibility to rationality, via abundant experimental examples focusing on MOS structure, including specific experimental steps with a strong level of operability. This book will be an essential reference for engineers in semiconductor related fields and academics and postgraduates within the field of microelectronics.
Product Identifiers
Publisher
Taylor & Francis LTD
ISBN-13
9781032106274
eBay Product ID (ePID)
2320078503
Product Key Features
Number of Pages
162 Pages
Language
English
Publication Name
Mos Interface Physics, Process and Characterization
Publication Year
2021
Subject
Engineering & Technology
Type
Textbook
Subject Area
Material Science, Electrical Engineering
Format
Hardcover
Dimensions
Item Height
229 mm
Item Weight
481 g
Item Width
152 mm
Additional Product Features
Country/Region of Manufacture
United Kingdom
Item description from the seller
Seller business information
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